王致皓

Chih-Hao Wang

chwang.peter@gmail.com

2013年畢業於國立中山大學電機系加入可測及可靠系統實驗室就讀碩士班，並於2014年申請通過逕行攻讀博士。主要研究方向為VLSI設計與測試、VLSI可靠度提升、錯誤診斷、即時偵錯以及相關演算法開發。興趣為小提琴。

Chih-Hao Wang(S?rsquo;17) received his B.S. degree in electrical engineering from National Sun Yat-sen University, Kaohsiung, Taiwan in 2013. He is currently working toward the Ph.D. degree in electrical engineering at the same university under the supervision of Dr. Tong-Yu Hsieh. His recent research interests are centered on VLSI design and testing, VLSI reliability improvement, fault diagnosis, and concurrent error detection methods.

Research topic:

concurrent error detection, fault diagnosis

Paper publications:

期刊論文 (Journal)

1. C.-H. Wang and T.-Y. Hsieh, ?quot;On probability of detection lossless concurrent error detection based on implications,?quot; IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, DOI (identifier) 10.1109/TCAD.2017.2740289, pp. 1-14, Aug. 2017.

2. T.-Y, Hsieh, C.-H. Wang, T.-L. Chih, and Y.-H. Chi, ?quot;A performance degradation tolerable cache design by exploiting memory hierarchies,?quot; IEEE Trans. on VLSI Systems, Vol. 24, No. 2, pp. 784-788, Feb. 2016.

3. T.-Y. Hsieh, C.-H. Wang, C.-W. Kuo, S.-Y. Huang and T.-L. Chih, ?quot;Performance degradation tolerance analysis and design for effective yield enhancement,?quot; Journal of Electronic Testing, Vol. 31, No. 5, pp. 427-441, Dec. 2015.

研討會論文 (Conference)

1. C.-H. Wang and T.-Y. Hsieh, ?quot;A hybrid concurrent error detection scheme for simultaneous improvement on probability of detection and diagnosability,?quot; IEEE Int?rsquo;l. Test Conference in Asia, pp. 1-6, Sep. 2017. (presented byC.-H. Wang)

宋子樵

Tzu-Chiao Sung

finley.song@gmail.com

嗜好為棒球、足球、看影集、籃球。

Tzu-Chiao Sung born in Kaohsiung, Taiwan in 1984. He received B.S. and M.S. degrees in electronic engineering from Southern Taiwan University, Tainan, Taiwan, in 2006 and 2010 respectively. He is currently working toward the Ph.D degree in Department of Electrical Engineering at National Sun Yat-Sen University, Kaohsiung, Taiwan.His recent research interests include VLSI design and low power circuit design.

Research topic:

low-power error-tolerable image processing circuit designs